Name: 2018 Joint Statistical Meetings
Start: 2018-07-28T07:00:00+00:00
End: 2018-08-02
Location: Vancouver Convention Centre

Legend:
CC = Vancouver Convention Centre F = Fairmont Waterfront Vancouver
* = applied session ! = JSM meeting theme

Keyword Search Criteria: HFSS Scattering parameters returned 2 record(s)

Tuesday, 07/31/2018

An Application of Machine Learning for 3D IC Defect Detection
Meihui Guo, National Sun Yat-Sen University; Yu-Jung Huang, I-Shou University

An Application of Machine Learning for 3D IC Defect Detection
Meihui Guo, National Sun Yat-Sen University; Yu-Jung Huang, I-Shou University
11:40 AM

JSM 2018 Online Program